A Genetic Algorithm for Sequential Circuit Test Generation based on Symbolic Fault Simulation   [GA] [TG]

by

Gockel, N., Keim, M., Drechsler, R. and Becker, B.

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Info: Genetic Programming 1997: Proceedings of the Second Annual Conference (Conference proceedings), 1997, p. 363-369
Keywords:Genetic Algorithms
Notes:
GP-97
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BibTex:
@InProceedings{Gockel:1997:GAsctg,
  author =       "Nicole Gockel and Martin Keim and Rolf Drechsler and
                 Bernd Becker",
  title =        "A Genetic Algorithm for Sequential Circuit Test
                 Generation based on Symbolic Fault Simulation",
  booktitle =    "Genetic Programming 1997: Proceedings of the Second
                 Annual Conference",
  editor =       "John R. Koza and Kalyanmoy Deb and Marco Dorigo and
                 David B. Fogel and Max Garzon and Hitoshi Iba and Rick
                 L. Riolo",
  year =         "1997",
  month =        "13-16 " # jul,
  keywords =     "Genetic Algorithms",
  pages =        "363--369",
  address =      "Stanford University, CA, USA",
  publisher_address = "San Francisco, CA, USA",
  publisher =    "Morgan Kaufmann",
  notes =        "GP-97",
}